Test Time and Test Cost

Once the test program has been developed and is ready for production, the test time it takes to test each insertion becomes extremely important. The average unit price (AUP) of the IC is directly affected by an increase in test time because we test each individual IC as part of the manufacturing process.

We must try to minimize the test time while ensuring robust quality requirements on each device shipped to the customer by:

  1. Using Design for Test (DFT) methodologies as part of the IC design process
  2. Multi-site/Parallel test
  3. Developing efficient test algorithms
MultiSite Test Cost Calculator





Number of Sites
Handler Index Time secs
Parallel test time secs
Serial test time secs
Test Cost /hr.

Test Cost per device is $nan

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